National Repository of Grey Literature 3 records found  Search took 0.01 seconds. 
Radiation damage of samples in low-voltage transmission electron microscopy
Vykydal, Václav ; Valterová, Eva (referee) ; Kolář, Radim (advisor)
This thesis is focused on Radiation damage of samples in low-voltage transmission electron microscopy. In thesis is general description of transmission electron microscopy and their important parts. There is described how samples are damaged by primary electron beam and how samples for transmission electron microscopy are prepared and which degradation occurs from the point of view materials of sample and time dose of electrons from primary electron beam.
Radiation damage of samples in low-voltage transmission electron microscopy
Vykydal, Václav ; Valterová, Eva (referee) ; Kolář, Radim (advisor)
This thesis is focused on Radiation damage of samples in low-voltage transmission electron microscopy. In thesis is general description of transmission electron microscopy and their important parts. There is described how samples are damaged by primary electron beam and how samples for transmission electron microscopy are prepared and which degradation occurs from the point of view materials of sample and time dose of electrons from primary electron beam.
The first experience with the specimen preparation for low-voltage transmission electron microscope
Nebesářová, Jana ; Vancová, Marie
The low-voltage transmission electron microscope, working in the TEM mode, requires ultrathin sections with a thickness 20-30nm. This demand brings problems with a section cohesion caused by insufficient resin infiltration and with a chatter caused by unequal thickness of the section. The contrast of unstained biological specimens in LV TEM is comparable with the contrast obtained in HV TEM of stained specimens.

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